overview

・ Slit unevenness of LCD panel / OLED panel,

Inspection of area unevenness, spot unevenness, etc. is possible.

・ Comparison of each abnormality with the reference data and adjacent areas

Judgment of pass / fail through comparison with.

​feature

・ High resolution inspection Sub-micro class for minute defects

Inspection technology.

-Fatal defect extraction and classification.

・ High-speed review technology for minute defects.

・ Optical system development, especially for OLED panels

Optical system development technology specialized for flexible processes.

・ By using our own development control software

High stability.

・ Mass production equipment for domestic and overseas customers (Japan, China, South Korea)

As a result, there are many achievements.