Panel Mura Inspection
Unevenness inspection device
overview
・ Slit unevenness of LCD panel / OLED panel,
Inspection of area unevenness, spot unevenness, etc. is possible.
・ Comparison of each abnormality with the reference data and adjacent areas
Judgment of pass / fail through comparison with.
feature
・ High resolution inspection Sub-micro class for minute defects
Inspection technology.
-Fatal defect extraction and classification.
・ High-speed review technology for minute defects.
・ Optical system development, especially for OLED panels
Optical system development technology specialized for flexible processes.
・ By using our own development control software
High stability.
・ Mass production equipment for domestic and overseas customers (Japan, China, South Korea)
As a result, there are many achievements.
specification
* Please contact us for detailed structure and specifications.